- Study guides, Class notes & Summaries

VLSI Testing and Design for Testability UPDATED ACTUAL Exam Questions and CORRECT Answers Logic Verification - CORRECT ANSWER accurately. Silicon Debug - CORRECT ANSWER Manufacturing Test - CORRECT ANSWER quality. Fault Models - CORRECT ANSWER Observability - CORRECT ANSWER Controllability - CORRECT ANSWER Design for Test - CORRECT ANSWER effective. Scan Design - CORRECT ANSWER controllability. BIST - CORRECT ANSWER - Ensures chip perfor...

Test of VLSI 1 UPDATED ACTUAL Exam Questions and CORRECT Answers functional test - CORRECT ANSWER - development errors : correct functionality of the modules is tested in a functional test; a high coverage of the fault is targeted, leading to a long test process structural test - CORRECT ANSWER - physical or manufacturing defects: the presence of all signal lines, and their ability to carry 0 and 1s is checked in a structural test Verification - CORRECT ANSWER - Predic...

Test of VLSI 2 UPDATED ACTUAL Exam Questions and CORRECT Answers Defect - CORRECT ANSWER hardware and its intended design - hardware, physical level error - CORRECT ANSWER fault - CORRECT ANSWER fault model - CORRECT ANSWER - unintended difference between the implemented - wrong output signal produced by a defective system - representation of a defect at the abstracted function leve

Test of VLSI 4 UPDATED ACTUAL Exam Questions and CORRECT Answers Purpose of testability measure - CORRECT ANSWER inexpensive method to quantify how hard it is to set or observe internal signals of a circuit Controllability - CORRECT ANSWER - Need to have a computationally - difficulty of setting a particular signal to logic 0 or 1 Observability - CORRECT ANSWER signal Testability analysis - CORRECT ANSWER Controllability/Observability Analysis Program) - diff...

VLSI Circuit Testing Phases and Techniques UPDATED ACTUAL Exam Questions and CORRECT Answers Prototype Testing - CORRECT ANSWER under microscope. Visual Inspection - CORRECT ANSWER Fault Localization - CORRECT ANSWER Process Induced Faults - CORRECT ANSWER like pin-holes. Design Faults - CORRECT ANSWER contacts. - Initial evaluation of first prototype wafers - Microscopic examination of circuits for faults. - Identifying and pinpointing faults in circuits. - ...

VLSI chapter 1 UPDATED ACTUAL Exam Questions and CORRECT Answers SSI - CORRECT ANSWER MSI - CORRECT ANSWER LSI - CORRECT ANSWER VLSI - CORRECT ANSWER Memory, DSP ULSI - CORRECT ANSWER - 10 gates , 60s , gates and op amps - 100-1000 gates , 70s , filters - 1000-10,000, 80s, microprocessors and A-D - 10,000-100,000 gates ,90's - 10,00,000-1,00,00,000 gates (~ 1million -10 million gates

VLSI chapter 1 UPDATED Exam Questions and CORRECT Answers IC - CORRECT ANSWER - Integrated Circuit incorporates and interconnects a multiude of miniature electronic devices (transistors) on a single piece of SD material (silicon) pad - CORRECT ANSWER - connector on a die that is intended to be wired or otherwise electrically connected to a package pin. PCB - CORRECT ANSWER Die size - CORRECT ANSWER GE - CORRECT ANSWER four MOSFETs in static CMOS MOSFET - C...

VLSI Testing UPDATED ACTUAL Exam Questions and CORRECT Answers Yield - CORRECT ANSWER Reject Rate - CORRECT ANSWER Quality - CORRECT ANSWER - Acceptable parts divided by total parts fabricated. - Faulty parts passing final test divided by total. - Working parts passing final test divided by total. Quality Formula - CORRECT ANSWER - Quality equals 1 minus reject rate. Yield estimation according to Poisson - CORRECT ANSWER defect density and A is chip area Yield es...

VLSI Exam 1 UPDATED Exam Questions and CORRECT Answers When two 2Y/4Y transistors are connected in series its equivalent resistance can be calculated from a single transistor with size: - CORRECT ANSWER - 4Y/4Y *cannot reduce* When two 2Y/4Y transistors are connected in parallel its equivalent resistance can be calculated from a single transistor with size: - CORRECT ANSWER - 2Y/8Y The starting material of the n-well process is: - CORRECT ANSWER type substrate - lightly...