VLSI Circuit Testing Phases and Techniques
UPDATED ACTUAL Exam Questions and
CORRECT Answers
Prototype Testing - CORRECT ANSWER - Initial evaluation of first prototype wafers
under microscope.
Visual Inspection - CORRECT ANSWER - Microscopic examination of circuits for faults.
Fault Localization - CORRECT ANSWER - Identifying and pinpointing faults in circuits.
Process Induced Faults - CORRECT ANSWER - Defects caused by manufacturing issues
like pin-holes.
Design Faults - CORRECT ANSWER - Errors due to incorrect design, like missing
contacts.
Voltage Contrast Technique - CORRECT ANSWER - Uses electron microscope for logic
state verification.
Parametric Tests - CORRECT ANSWER - Evaluates circuit speed, power, and temperature
performance.
Production Testing - CORRECT ANSWER - Testing focused on efficiency and quick
decision-making.
Wafer Prober - CORRECT ANSWER - Device that contacts individual pads on a wafer.
UPDATED ACTUAL Exam Questions and
CORRECT Answers
Prototype Testing - CORRECT ANSWER - Initial evaluation of first prototype wafers
under microscope.
Visual Inspection - CORRECT ANSWER - Microscopic examination of circuits for faults.
Fault Localization - CORRECT ANSWER - Identifying and pinpointing faults in circuits.
Process Induced Faults - CORRECT ANSWER - Defects caused by manufacturing issues
like pin-holes.
Design Faults - CORRECT ANSWER - Errors due to incorrect design, like missing
contacts.
Voltage Contrast Technique - CORRECT ANSWER - Uses electron microscope for logic
state verification.
Parametric Tests - CORRECT ANSWER - Evaluates circuit speed, power, and temperature
performance.
Production Testing - CORRECT ANSWER - Testing focused on efficiency and quick
decision-making.
Wafer Prober - CORRECT ANSWER - Device that contacts individual pads on a wafer.
