Spi 2 Exam 1 Updated Actual Questions And Correct Answers

SPI 2 EXAM 1 UPDATED ACTUAL
QUESTIONS AND CORRECT ANSWERS
Question:
1. axial resolution
Answer:
- ability to distinguish reflectors parallel to beam LARD- longitudinal, axial, range, depth

Question:
2. what is axial resolution determined by
Answer:
SPL
- improved by decreasing SPL (more damping, higher freq.)
- decreased SPL = decreased AR -> damping

Question:
3. axial resolution is constant with _____
Answer:
depth

Question:
4. axial resolution equation
Answer:
SPL/2
-> wavelength x # cycles per pulse / 2 OR c x # cycles per pulse / 2f

Question:
5. SPL equation
Answer:
c x # cycles / 2f or wavelength x # cycles / 2

Question:
6. lateral resolution
Answer:
- ability to distinguish reflectors perpendicular to beam LATA- lateral, angular, transverse, azimuthal

Question:
7. lateral resolution is determined by
Answer:
beam width

Question:
8. lateral resolution is improved by
Answer:
focusing

, Question:
9. lateral resolution varies with ____
Answer:
depth, but is best at the focus

Question:
10. elevational resolution
Answer:
ability to distinguish reflectors in the thickness of the beam (Z axis)
- synonyms: slice thickness, section thickness

Question:
11. elevational resolution is determined by
Answer:
beam thickness

Question:
12. elevational resolution is improved by
Answer:
- focusing (mechanical lens, curved crystal, or 2D arrays), increasing frequency, and harmonics (beam
is narrower)

Question:
13. contrast resolution
Answer:
ability to distinguish subtle differences in brightness (echogenecity)

Question:
14. contrast resolution is determined by
Answer:
bits/pixel, dynamic range, pixel count

Question:
15. contrast resolution is improved with
Answer:
higher bit depth, and proper settings

Question:
16. temporal resolution
Answer:
ability to follow motion in time

Question:
17. temporal resolution is determined by
Answer:
FR!, line density, lines/frame