IASSC Black Belt KEY EXAM Questions And
CORRECT Answers
Two main categories of Kanban - CORRECT ANSWERS (1) finished good Kanban (intra-
process); production instruction Kanban (PIK) and signal; (2) incoming material Kanban
(withdrawal); inter-process, supplier
Defect prevention - CORRECT ANSWERS gain permanency of the improvement by
eliminating or rigidly defining human intervention in a process
Sigma level and definition of Full Automation (defect prevention) - CORRECT ANSWERS 5-
6σ; systems that monitor the process and automatically adjust critical X's to correct settings
Sigma level and definition of Process Interruption (defect prevention) - CORRECT
ANSWERS 4-5σ; mechanism installed that shuts down the process and prevents further
operation until a required action is performed
Sigma level and definition of Mistake Proofing (defect prevention) - CORRECT ANSWERS 3-
5σ; using wisdom, ingenuity, or serendipity to create devices allowing a 100% defect free step
100% of the time
I-MR Chart - CORRECT ANSWERS aka individuals and moving range. Combines a control
chart of the average moving range with the individuals chart. Tracks both process level and
process variation. Shows individual measurement values plotted against a center line (average);
shows the range between two subsequent measures; subgroup of 1
Xbar-R chart - CORRECT ANSWERS aka mean and range. Used primarily to monitor the
stability of the average value. Sensitive method to identify assignable causes of product and
process variation and gives great insight into short-term variations. Plots the average values of
each of a number of small sampled subgroups. Continuous data, sample size 2-5
, U chart - CORRECT ANSWERS aka incidences per unit. plots defects per unit data collected
from subgroups of equal or unequal sizes; attribute data, defects, variable subgroups
C chart - CORRECT ANSWERS aka number of incidences. plots defects per unit data
collected from subgroups of equal sizes; attribute data, defects, constant subgroups
P chart - CORRECT ANSWERS aka proportion defectives. plots the proportion of
nonconforming units collected from subgroups of equal or unequal size. Tracking defectives -
good/bad, pass/fail, accept/reject, etc. attribute data, defectives, variable sample size
NP Chart - CORRECT ANSWERS aka number of defectives. plots the proportion of
nonconforming units collected from subgroups of equal size.
Xbar-S chart - CORRECT ANSWERS aka mean and std. dev.
CumSum chart - CORRECT ANSWERS aka cumulative sum.
EWMA chart - CORRECT ANSWERS aka exponentially weighted moving average. Useful for
considering past and historical data. Most commonly used for individual measurements.
Frequency of sampling rule of thumb - CORRECT ANSWERS Sample a process at least 10
times more frequent than the frequency of "out of control" conditions
Poisson Capability Analysis - CORRECT ANSWERS Measures the stability of a single process
step (or data collection point) over time and reports on the long-term capability (using DPU) of
that step based on the observed avg. defective rate. Discrete data, defects, C and U charts, y =
(np)^r*e^-np / r!
CORRECT Answers
Two main categories of Kanban - CORRECT ANSWERS (1) finished good Kanban (intra-
process); production instruction Kanban (PIK) and signal; (2) incoming material Kanban
(withdrawal); inter-process, supplier
Defect prevention - CORRECT ANSWERS gain permanency of the improvement by
eliminating or rigidly defining human intervention in a process
Sigma level and definition of Full Automation (defect prevention) - CORRECT ANSWERS 5-
6σ; systems that monitor the process and automatically adjust critical X's to correct settings
Sigma level and definition of Process Interruption (defect prevention) - CORRECT
ANSWERS 4-5σ; mechanism installed that shuts down the process and prevents further
operation until a required action is performed
Sigma level and definition of Mistake Proofing (defect prevention) - CORRECT ANSWERS 3-
5σ; using wisdom, ingenuity, or serendipity to create devices allowing a 100% defect free step
100% of the time
I-MR Chart - CORRECT ANSWERS aka individuals and moving range. Combines a control
chart of the average moving range with the individuals chart. Tracks both process level and
process variation. Shows individual measurement values plotted against a center line (average);
shows the range between two subsequent measures; subgroup of 1
Xbar-R chart - CORRECT ANSWERS aka mean and range. Used primarily to monitor the
stability of the average value. Sensitive method to identify assignable causes of product and
process variation and gives great insight into short-term variations. Plots the average values of
each of a number of small sampled subgroups. Continuous data, sample size 2-5
, U chart - CORRECT ANSWERS aka incidences per unit. plots defects per unit data collected
from subgroups of equal or unequal sizes; attribute data, defects, variable subgroups
C chart - CORRECT ANSWERS aka number of incidences. plots defects per unit data
collected from subgroups of equal sizes; attribute data, defects, constant subgroups
P chart - CORRECT ANSWERS aka proportion defectives. plots the proportion of
nonconforming units collected from subgroups of equal or unequal size. Tracking defectives -
good/bad, pass/fail, accept/reject, etc. attribute data, defectives, variable sample size
NP Chart - CORRECT ANSWERS aka number of defectives. plots the proportion of
nonconforming units collected from subgroups of equal size.
Xbar-S chart - CORRECT ANSWERS aka mean and std. dev.
CumSum chart - CORRECT ANSWERS aka cumulative sum.
EWMA chart - CORRECT ANSWERS aka exponentially weighted moving average. Useful for
considering past and historical data. Most commonly used for individual measurements.
Frequency of sampling rule of thumb - CORRECT ANSWERS Sample a process at least 10
times more frequent than the frequency of "out of control" conditions
Poisson Capability Analysis - CORRECT ANSWERS Measures the stability of a single process
step (or data collection point) over time and reports on the long-term capability (using DPU) of
that step based on the observed avg. defective rate. Discrete data, defects, C and U charts, y =
(np)^r*e^-np / r!
